From: Pei Xiao <xiaopei01@kylinos.cn>

The for_each_child_of_node() macro automatically manages device node
reference counts during normal iteration. However, when breaking out
of the loop early with return, the current iteration's node is not
automatically released, leading to a reference count leak.

Fix this by adding of_node_put(child) before returning from the loop
when emc2305_set_single_tz() fails.

This issue could lead to memory leaks over multiple probe cycles.

Signed-off-by: Pei Xiao <xiaopei01@kylinos.cn>
---
 drivers/hwmon/emc2305.c | 4 +++-
 1 file changed, 3 insertions(+), 1 deletion(-)

diff --git a/drivers/hwmon/emc2305.c b/drivers/hwmon/emc2305.c
index 60809289f816..84cb9b72cb6c 100644
--- a/drivers/hwmon/emc2305.c
+++ b/drivers/hwmon/emc2305.c
@@ -685,8 +685,10 @@ static int emc2305_probe(struct i2c_client *client)
 			i = 0;
 			for_each_child_of_node(dev->of_node, child) {
 				ret = emc2305_set_single_tz(dev, child, i);
-				if (ret != 0)
+				if (ret != 0) {
+					of_node_put(child);
 					return ret;
+				}
 				i++;
 			}
 		} else {
-- 
2.25.1

On Fri, Dec 05, 2025 at 11:15:13AM +0800, xiaopeitux@foxmail.com wrote:
> From: Pei Xiao <xiaopei01@kylinos.cn>
> 
> The for_each_child_of_node() macro automatically manages device node
> reference counts during normal iteration. However, when breaking out
> of the loop early with return, the current iteration's node is not
> automatically released, leading to a reference count leak.
> 
> Fix this by adding of_node_put(child) before returning from the loop
> when emc2305_set_single_tz() fails.
> 
> This issue could lead to memory leaks over multiple probe cycles.
> 
> Signed-off-by: Pei Xiao <xiaopei01@kylinos.cn>

Applied.

Thanks,
Guenter