On Tue, Jul 15, 2025 at 02:32:37PM +0800, Xu Yilun wrote:
> It is to solve the lifecycle issue that vdevice may outlive idevice. It
> is a prerequisite for TIO, to ensure extra secure configurations (e.g.
> TSM Bind/Unbind) against vdevice could be rolled back on idevice unbind,
> so that VFIO could still work on the physical device without surprise.
>
> Changelog:
> v5:
> - Further rebase to iommufd for-next 601b1d0d9395
> - Keep the xa_empty() check in iommufd_fops_release(), update comments
> - Move the *idev next to *viommu for struct iommufd_vdevice
> - Update the description about IOMMUFD_CMD_VDEVICE_ALLOC for lifecycle
> - Remove Baolu's tag for patch 4 because of big changes since v3
> - Add changelog about idev->destroying
> - Adjust line wrappings for tools/testing/selftests/iommu/iommufd.c
> - Clarify that no testing for tombstoned ID repurposing.
> - Add review tags.
With the patch that I attached in my reply to PATCH-5, sanity works
fine per iommufd's selftest and by testing tegra241-cmdqv in a VM.
So, upon fixing the build break in PATCH-5 (maybe for a v6),
Tested-by: Nicolin Chen <nicolinc@nvidia.com>